Design for Test (aka « Design for Testability » or « DFT ») is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. … in-situ to obtain the best possible test coverage (TEST EXPERT).
Predictive analysis of test coverage
Authorized Training Center (Regional Directorate of Labour, Employment and Vocational Training)
Programs transfers between different ICT test platform
Technical assistance, upgrading program (… on customer site or duplication)
Rent a tester on our site (with or without technical assistance for your development and production)
Electronics board supply for the test solution (relay, multiplexer, frequency divider…)