• Tests integrated circuits of UUT and interconnects between IC’s,
• Provides higher (and more accurate) fault diagnostics,
• Works mostly with digital components, very little analog components coverage,
• UUT is not operated “at-speed” and is not operated as it would in “real life”

• Integrity Test of Boundary Scan chains components.
• Interconnections Test of the Boundary scan chains either directly or via transparency rules (Resistors in series, Buffers,…).
• Synchronous or asynchronous memory clusters test : SDRAM, SSRAM, SRAM, DDR2SDRAM, FIFO …
• Components test and programming: PLD, Flash, NandFlash, Flash SPI, EEPROM SPI or I2C
• Connectors test by loop on IO extensions cards
• Systems test by multiples relay cards with connectors.
• Specifics cluster test script in language TCL to test logic circuits, LCD, drivers…

We can integrate this solution into ICT testers AGILENT 3×7x, TERADYNE SPECTRUM 88xx et GR228x and IFR4220… but also in a FCT solution or a standalone bench.
This test method uses DCOM technology to interface test software.
We also integrate the solution Goepel on these same testers.

We can ensure these services :

• Feasibility study
• Realisation of specific test fixture
• Program test development
• Technical support
• Training

We are in partnership with TEMENTO SYSTEMS